Abstract:
PROBLEM TO BE SOLVED: To provide an immersion lithographic apparatus in which the generation of bubbles in immersion liquid is reduced. SOLUTION: The immersion lithographic projection apparatus has a liquid confinement structure configured to at least partly confine liquid to a space between a projection system and a substrate, the confinement structure has a buffer surface, and the buffer surface, when in use, is positioned in close proximity to a plane substantially comprising the upper surface of the substrate and of a substrate table holding the substrate to define a passage having a flow resistance. A recess is provided in the buffer surface, the recess, when in use, is normally full of the immersion liquid to achieve rapid filling of a gap between the substrate and substrate table as the gap moves under the buffer surface. The recess may be annular or radial and a plurality of recesses may be provided. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide immersion lithography equipment in which the generation of air bubbles in an immersion liquid is reduced. SOLUTION: Immersion lithography projection equipment has a liquid-confining structure configured so as to confine liquid at least partially in a space between a projection system and a substrate. The confining structure has a buffering plane which is arranged when in use, very close to the a plane substantially including the substrate and the top surface of a substrate table that holds the substrate, and defines a path having flow resistance. In this buffering plane, recesses are formed and normally filled with liquid when in use so that a gap is rapidly filled therewith when the gap between the substrate and the substrate table moves under the buffering plane. The recess may be formed into an annular or a radial shape so that a plurality of recesses can be arranged. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
A method of operating a lithographic apparatus is disclosed. The method includes moving a substrate table supporting a substrate relative to a projection system and adjusting the scanning speed between the substrate table and the projection system during imaging of a target within a predefined area at or near an edge of the substrate, or adjusting the stepping speed between adjacent target positions in a predefined area at or near the edge of the substrate, or both. The adjusting the scanning and/or stepping speed may comprise lowering the speed. The projection system is configured to project a patterned beam of radiation on to a target portion of the substrate.
Abstract:
A lithographic apparatus comprising: an illumination system (IL) configured to condition a radiation beam (PB); a support (MT) constructed to support a patterning device (MA), the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; a substrate table (WT) constructed to hold a substrate (W); a projection system (PL) configured to project the patterned radiation beam onto a target portion of the substrate; a liquid supply system (130) configured to at least partly fill a space (25) between a final element of said projection system and said substrate with liquid; a seal member (12) arranged substantially to contain said liquid within said space between said final element of the projection system and said substrate; and elements (30,50,60,120,140) to control and/or compensate for evaporation of immersion liquid from said substrate.