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公开(公告)号:NL2005655A
公开(公告)日:2011-06-14
申请号:NL2005655
申请日:2010-11-09
Applicant: ASML NETHERLANDS BV
Inventor: ROPS CORNELIUS , KEMPER NICOLAAS , RIEPEN MICHEL
IPC: G03F7/20
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公开(公告)号:NL1036186A1
公开(公告)日:2009-06-04
申请号:NL1036186
申请日:2008-11-12
Applicant: ASML NETHERLANDS BV
Inventor: KROONEN ROGER JOHANNES MARIA HUBERTUS , CORNELISSEN SEBASTIAAN MARIA JOHANNES , DONDERS SJOERD NICOLAAS LAMBER , KATE NICOLAAS TEN , HAM RONALD VAN DER , ROSET NIEK JACOBUS JOHANNES , JACOBS FRANCISCUS MATHIJS , RIEPEN MICHEL , JANSSEN GERARDUS ARNOLDUS HENDRICUS FRANCISCUS , ROOS REINDER WIETSE , HOGELAND MATTIJS
IPC: G03F7/20 , H01L21/027
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公开(公告)号:DE102006042987B4
公开(公告)日:2012-01-19
申请号:DE102006042987
申请日:2006-09-13
Applicant: ASML NETHERLANDS BV , ZEISS CARL SMT GMBH
Inventor: EHM DIRK HEINRICH DR , RUNSTRAAT ANNEMIEKE VAN DE DR , WOLSCHRIJN BASTIAAN THEODOOR DR , STORM ARNOLD DR , STEIN THOMAS DR , MEIJERINK MARCO G H , BASTEIN TON , SOEST-VERCAMMEN ESTHER L J VAN , KOSTER NORBERTUS BENEDICTUS , GUBBELS FRITS G H M , OPREL PETER J , NIENOORD MICHIEL , RIEPEN MICHEL , MOORS ROEL JOHANNES HUBERTUS JOSEPHINA DR
Abstract: Verfahren zum Reinigen eines innerhalb einer Kammer angeordneten reflektiven optischen Elements für den weichen Röntgen- und extremen ultravioletten Wellenlängenbereich mit einer katalytischen Deckschicht mit den Schritten: – Aufheizen des reflektiven optischen Elements zumindest im Bereich der katalytischen Deckschicht auf 150°C und mehr; und – Zuleiten von molekularem Wasserstoff, zumindest in den Bereich der katalytischen Deckschicht, mit einem Partialdruck zwischen 0,01 mbar und 1 mbar.
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公开(公告)号:SG176490A1
公开(公告)日:2011-12-29
申请号:SG2011084712
申请日:2009-05-28
Applicant: ASML NETHERLANDS BV
Inventor: CLOIN CHRISTIAN GERARDUS NORBERTUS HENDRICUS MARIE , TEN KATE NICOLAAS , KEMPER NICOLAAS RUDOLF , STAVENGA MARCO KOERT , EUMMELEN ERIK HENRICUS EGIDIUS CATHARINA , RIEPEN MICHEL , ELISSEEVA OLGA VLADIMIROVNA , TIJMEN WILFRED MATHIJS GUNTHER , VAN DER WEKKEN MICHAEL CHRISTIAAN
Abstract: A lithographic projection apparatus is disclosed that includes a table, a shutter member, a fluid handling structure, and a fluid extraction system. The fluid handling structure may be configured to supply and confine liquid between a projection system and (i) a substrate, or (ii) the table, or (iii) a surface of the shutter member, or (iv) a combination selected from (i)-(iii). The surface of the shutter member may adjoin and be co-planar with a surface of the table. The surfaces of the shutter member and the table may be spaced apart by a gap. The fluid extraction system may be configured to remove liquid from the gap.Fig. 12b
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公开(公告)号:NL2006615A
公开(公告)日:2011-11-14
申请号:NL2006615
申请日:2011-04-18
Applicant: ASML NETHERLANDS BV
Inventor: CORTIE ROGIER , RIEPEN MICHEL , CORNELISSEN ROB
IPC: G03F7/20
Abstract: A fluid handling structure for a lithographic apparatus is disclosed. The fluid handling structure has, on an undersurface, a liquid supply opening or a plurality of liquid supply openings and a liquid extraction opening or a plurality of liquid extraction openings arranged such that, in use, liquid is provided on and removed from the undersurface of the fluid handling structure.
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公开(公告)号:NL2006054A
公开(公告)日:2011-08-10
申请号:NL2006054
申请日:2011-01-24
Applicant: ASML NETHERLANDS BV
Inventor: RIEPEN MICHEL , ROPS CORNELIUS , VERDONCK ADRIANUS MARINUS , EUMMELEN ERIK , GRAAF SANDRA , CORTIE ROGIER HENDRIKUS MAGDALENA , KANEKO TAKESHI , DZIOMKINA NINA , BOKHOVEN LAURENTIUS , EVANGELISTA FABRIZIO , BESSEMS DAVID
IPC: G03F7/20
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公开(公告)号:SG166747A1
公开(公告)日:2010-12-29
申请号:SG2010034312
申请日:2010-05-17
Applicant: ASML NETHERLANDS BV
Inventor: RIEPEN MICHEL , KEMPER NICOLAAS RUDOLF
Abstract: A fluid handling structure has a plurality of openings acting as a meniscus pinning system operating on the gas drag principle and a gas knife outwardly of the meniscus pinning system to break-up any film of liquid left behind. The separation between the gas knife and the meniscus pinning system is selected from the range of 1 mm to 5 mm. Desirably the underside of a barrier member in which the gas knife and the meniscus pinning system are provided is continuous, e.g. has no openings, between the gas knife and the meniscus pinning system. [Fig. 6]
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69.
公开(公告)号:NL2003226A
公开(公告)日:2010-03-09
申请号:NL2003226
申请日:2009-07-17
Applicant: ASML NETHERLANDS BV
Inventor: KEMPER NICOLAAS , ANTONEVICI ANCA , KATE NICOLAAS , OTTENS JOOST , BECKERS MARCEL , POLIZZI MARCO , RIEPEN MICHEL , KUIJPER ANTHONIE , STEFFENS KOEN , BAETEN ADRIANES
IPC: G03F7/20
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公开(公告)号:SG157300A1
公开(公告)日:2009-12-29
申请号:SG2009031923
申请日:2009-05-08
Applicant: ASML NETHERLANDS BV
Inventor: RIEPEN MICHEL , KEMPER NICOLAAS RUDOLF , VERMEULEN JOHANNES PETRUS MART , DIRECKS DANIEL JOZEF MARIA , PHILIPS DANNY MARIA HUBERTUS , VAN PUTTEN ARNOLD JAN
Abstract: An immersion lithographic apparatus is described in which a liquid removal device is arranged to remove liquid from the substrate, e.g. during exposures, through a plurality of elongate slots arranged along a line and angled to that line. The liquid removal device may act as a meniscus pinning device in an immersion hood or may be used in a drying device to remove a droplet from the substrate.
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