Abstract:
PROBLEM TO BE SOLVED: To provide an optoelectronics constituent element capable of being used in various manners particularly. SOLUTION: An optoelectronics constituent element comprises a laminate structure and a support. The laminate structure includes at least two active zones. The support is constituted such that the support is adhered to the laminate structure. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an efficient and small-sized beam detector of a small required area which can be easily manufactured at a low cost for sensing a beam present in a visible spectrum region. SOLUTION: A signal formed in a first sensing element is taken out separately from a signal formed in a second sensing element, the first sensing element is partially permeative in a visible beam, and the visible beam which has permeated the first sensing element forms a signal in the second sensing element. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To make directly formable an electric contact area on an n-conductive AlGaInP based or AlGaInAs based semiconductor layer. SOLUTION: A method includes: adjusting by epitaxial growth semiconductor layers having the n-conductive AlGaInP based or AlGaInAs based outer layers and an active zone that emits electromagnetic radiation; making an electric contact material having Au and at least one doping substance adhered to the outer layer; and tempering the outer layer. The doping substance used in the step of making the electric contact material adhered to the outer layer contains at least one element selected from the group consisting of Ge, Si, Sn, and Te. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To improve an aging characteristic of a semiconductor light emitting diode. SOLUTION: A layer sequence of an InGaAlP base is grown on an Si-doped GaAs wafer. The layer sequence includes an n-doped cover layer and active layer 14, and a magnesium-p-doped cover layer 20. Further, a GaP window layer 22 is grown on a p cover layer 20 during an epitaxial process at a temperature of 840 to 860°C. A diffusion-stop layer 16 is provided between the active layer 14 and the p cover layer 20 so as to suppress the diffusion of Mg-doping atom from the p cover layer to the active layer 14 (the diffusion usually occurs at high growth temperatures to the GaP window layer 22). The diffusion-stop layer 16 is strongly n-doped and comprises a bias loaded over grid. COPYRIGHT: (C)2004,JPO
Abstract:
The invention relates to a method for producing a radiation-emitting semiconductor chip based on AlGaInP, comprising the following steps: preparing a substrate; applying a series of semiconductor layers to the substrate, said series of layers containing a photon-emitting active layer, and; applying a transparent decoupling layer comprising Gax(InyAl1-y)1-xP, whereby 0.8
Abstract:
Halbleiterschichtenfolge (100) umfassend eine erste nitridische Verbindungshalbleiterschicht (1), eine zweite nitridische Verbindungshalbleiterschicht (2), und eine zwischen der ersten (1) und zweiten nitridischen Verbindungshalbleiterschicht (2) angeordnete Zwischenschicht (10),- wobei beginnend mit der ersten nitridischen Verbindungshalbleiterschicht (1) die Zwischenschicht (10) und die zweite nitridische Verbindungshalbleiterschicht (2) in einer Wachstumsrichtung (Z) der Halbleiterschichtenfolge (100) nachfolgend angeordnet sind,- wobei die Zwischenschicht (10) zumindest stellenweise eine von der ersten nitridischen Verbindungshalbleiterschicht (1) verschiedene Gitterkonstante aufweist,- wobei die zweite nitridische Verbindungshalbleiterschicht (2) zu der Zwischenschicht (10) zumindest stellenweise gitterangepasst ist, und- wobei die Zwischenschicht (10) Mikrorisse (11) umfasst und in den Mikrorissen (11) die zweite nitridische Verbindungshalbleiterschicht (2) zumindest stellenweise vorhanden ist.
Abstract:
Radiation-emitting semiconductor component comprises an n-doped casing layer (18), a p-doped casing layer (20), an active layer (14) based on InGaAlP arranged between the casing layers, and a diffusion stop layer (16) having a tensioned superlattice arranged between the active layer and the p-doped casing layer.
Abstract:
Semiconductor component comprises a thin film semiconductor body (2) arranged on a support (4) containing germanium. An Independent claim is also included for a process for the production of a semiconductor component.
Abstract:
In one embodiment the optoelectronic semiconductor chip (1) comprises an active zone with a multiple quantum well structure (3) containing a number of quantum well layers (31) and barrier layers (32) disposed sequentially in an alternating manner in a growth direction (G), each layer extending continuously over the entire multiple quantum well structure (3). When viewed in cross-section parallel to the growth direction (G), the multiple quantum well structure (3) has at least one emission region (41) and a number of transport regions (42) disposed sequentially in an alternating manner in a direction perpendicular to the growth region (G). The quantum well layers (31) and/or the barrier layers (32) in the transport regions (42) are thinner than and/or have a different material composition from those in the emission regions (41).